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Workshops & Seminars

The Measurement of Residual Stress using Laboratory Based X-Ray Diffraction Instruments; the Positives, the Pitfalls and a Round Robin

National Physical Laboratory, Teddington, UK

This event will be a one day workshop which will include a wide range of topics including, the basic principles of crystallography and of the laboratory based X-ray diffraction (XRD) method, it’s advantages and limitations. The measurement of awkward samples including curved ones, large ones and anisotropic materials will be covered. We will also discuss elastic constants given that we measure strain, not stress as well as methods layer removal. There will be an instrument manufacturer's forum with live demonstrations of portable residual stress diffractometers. We also intend to initiate a Round Robin to test the reproducibility XRD method with as wide a range of instruments and participants as possible. This Workshop is intended for everyone working in the field or who has an interest, both those who are experienced and particularly those who are new to the field and may need to make measurements in the future.

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